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Anasys Instruments  
Anasys儀器公司總部位于加利福尼亞圣巴巴拉市，是一支由AFM領(lǐng)域內(nèi)富有經(jīng)驗(yàn)的科研團(tuán)隊(duì)于2005年創(chuàng)立而成的。Anasys儀器公司致力于設(shè)計(jì)研發(fā)具有革命性的分析手段以更完美的在納米尺度下理解物質(zhì)的結(jié)構(gòu)，性能與功能。在2006年，我們推出了nanoTA標(biāo)志著我們進(jìn)入了納米熱性能分析領(lǐng)域。在2010年，Anasys推出了nanoIR測(cè)試平臺(tái)，引領(lǐng)了納米紅外分析技術(shù)并榮獲2010年度美國(guó)R&D100大獎(jiǎng)。在2012年，Anasys又一次充滿自豪的推出洛倫茲接觸共振技術(shù)（LCR）。這開創(chuàng)了寬頻納米動(dòng)態(tài)機(jī)械光譜領(lǐng)域。

Anasys Instruments is dedicated to delivering innovative products and solutions that measure nanoscale material properties. Understanding structure-property correlation, especially for samples with spatially varying physical and chemical properties, is critical in a diverse range of fields, including polymers, materials science, life science, semiconductors, and data storage, to name but a few. Anasys Instruments introduced nanothermal analysis (nano-TA) based on self-heating ThermaLever? AFM cantilever probes in 2006, allowing nanoscale measurements of thermal properties.

In 2010, Anasys Instruments proudly introduced the breakthrough multiple award-winning nanoIR? technology. This AFM-based solution enables chemical characterization utilizing infrared spectroscopy techniques at the nanoscale. By combining AFM and infrared spectroscopy, Anasys Instruments offers researchers an unprecedented suite of chemical, mechanical, and thermal property measurement capabilities.

Anasys Instruments unveiled the afm+ in Fall 2011. The afm+ is the first fully integrated AFM platform which offers three important analytical capabilities. The afm+ includes Anasys’ proprietary thermal probe technology (nano-TA), Scanning Thermal Microscopy (SThM) and Transition temperature microscopy (TTM) capabilities. The afm+ is fully upgradable to the Anasys nanoIR system.